Speed 2023
Submission to first editorial decision (median days): 8
Submission to acceptance (median days): 125
Usage 2023
Downloads: 170,090
Altmetric mentions: 9
Editors-in-Chief
Sherine Moharram, PhD, Electronics Research Institute, Egypt
Stefan Kozak, PhD, Slovak Technical University, Slovakia
Associate Editor-in-Chief
Mohamed Nour, Dr Eng, Electronics Research Institute, Egypt
Handling Editors
Jan Ciganek, Ing, PhD, Slovak Technical University, Slovakia
Mona Naguib Eskander, PhD, Electronics Research Institute, Egypt
Alena Kozakova, PhD, Slovak Technical University, Slovakia
Mohamed Nour, Dr Eng, Electronics Research Institute, Egypt
Said Wahsh, Ing, Electronics Research Institute, Egypt
Vladimir Kucera, PhD, The Institute of Information Theory and Automation, Czech Republic
Jan Murgas, Dr Eng, Slovak Technical University, Slovakia
Srinivasula Reddy, Dr Eng, PhD, CMR Engineering College, India
Danica Rosinova, Ing, PhD, Slovak Technical University, Slovakia
Dina Elessy, Ing, Electronics Research Institute, Egypt
Amal Hassan, PhD, Electronics Research Institute, Egypt
Rawya Yehia Rizk, Dr Eng, Port Said University, Egypt
Almotaz Youssef Abdel Elaziz, PhD, Ain Shams University, Egypt
Amany Mahmoud Mohamed Sarhan, PhD, Tanta University, Egypt
Nancy Mostafa Ahmed Salem, PhD, Helwan University, Egypt
Moamen Hanafy Ahmed Elmelegy, PhD, Assuit University, Egypt
Samir Eldessouki Elsayed Elmogy, PhD, Mansora University, Egypt
Abd Elhameed Abd El-moneim Mohamed Shalaan, PhD, Zagazig University, Egypt
Mahmoud Abd-Elrahman Abd-Elfattah Abd-Allah, PhD, Military Technical College, Egypt
Abou Eleilla Otaify Hassanain Aly, PhD, Cairo University, Egypt
Abdul-Basset Abdul-Sammed Jasim Al-Hussein, PhD, University of Basrah, Iraq
Shazia Saqib, PhD, University of Central Punjab, Pakistan
Oluwasegun Ishaya Adelaiye, Dr Eng, Bingham University, Nigeria
Elvis Twumasi, Dr Eng, Kwame Nkrumah University of Science and Technology, Ghana
C. J Prabhakar, PhD, Kuvempu University, India
Saira Andleeb Gillani, PhD, University of Central Punjab, Pakistan
Mahmoud Mohamed Salem, Dr Eng, Electronics Research Institute, Egypt
Mahmoud Fakhr Eldeen Hassan, Dr Eng, Electronics Research Institute, Egypt
Hala Abd Elmonaim Elsadek, PhD, Electronics Research Institute, Egypt
Ahmed Mohamed Attiya, PhD, Electronics Research Institute, Egypt
Heba Ahmed Shawki, PhD, Electronics Research Institute, Egypt
Hesham Elsayed Amin El-Khashab, Dr Eng, Electronics Research Institute, Egypt
Gehan Ahmed Bahgat, Dr Eng, Electronics Research Institute, Egypt
Editorial Board Members
Esmat Abdel Fatah, PhD, Electronics Research Institute, Egypt
Nader Bagherzadeh, PhD, University of California, USA
Hisham El-Deeb, PhD, Electronics Research Institute, Egypt
Hala El Sadek, PhD, Electronics Research Institute, Egypt
Tashio Fukuda, DSc, MEIJO University, Japan
Salwa Nassar, PhD, Electronics Research Institute, Egypt
Bars Ruth, PhD, The Institute of Information Theory and Automation, Czech Republic
Mahmoud Saleh, PhD, Electronics Research Institute, Egypt
Vojtech Vesely, DSc, PhD, Slovak Technical University, Slovakia
Abd-Elrazik Sebak, PhD, University of Concordia, Canada
Eric Amankwa, PhD, Presbyterian University, Ghana
Mary Immaculate Sheela Lourdusamy, PhD, Heritage Christian University College, Ghana
Mohd Wazir Bin Mustafa, PhD, Universiti Technologi Malaysia, Malaysia
Muhammad Shoaib, PhD, University of Engineering and Technology, Pakistan
Naveen Raman, PhD, Women’s Engineering College, India
Abdulkareem Swadi Abdullah, PhD, University of Basrah, Iraq
Said Elsayed Ismail Elkhamy, PhD, Alexandria University, Egypt
Gamal Eldeen Mohamed Aly, PhD, Ain Shams University, Egypt
Ahmed Bahgat Gamal Bahgat, PhD, Cairo University, Egypt
Atef Elsayed Abou Elazm, PhD, Menoufia University, Egypt
Diaa Abd El-Mageed Mohamed Khalil, PhD, Ain Shams University, Egypt
Speed 2023
Submission to first editorial decision (median days): 8
Submission to acceptance (median days): 125
Usage 2023
Downloads: 170,090
Altmetric mentions: 9
Journal of Electrical Systems and Information Technology is the official journal of Electronic Research Institute (ERI).